August 5th, 2014

DensBits' CTO to Participate in Open Plenary Session, 2014 Flash Memory Summit

Santa Clara Convention Center


Come and Hear DensBits' CTO Discuss "Is 3D NAND a Disruptive Technology for Flash Storage?"

Open Plenary Session, August 5th, 6:00 - 7:00pm

With 3D NAND scaling by adding vertical layers, we see diminishing returns and reliability degradation. In addition, lithography scaling is limited, and therefore adding bits per call becomes a major scaling factor. This introduces its own reliability issues.

design: J&J+A | dev: entry.
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